Access to Ultrafast Surface and Interface Carrier Dynamics Simultaneously in Space and Time
Published:
J. Zhao, R. O. Nughays, O. M. Bakr, O. F. Mohammed, Journal of Physical Chemistry C 125, 14495–14516 (2021).
This review article presents scanning ultrafast electron microscopy (S-UEM) as a surface-sensitive platform for resolving carrier dynamics at material interfaces with nanometer and femtosecond resolution. It summarizes the technique’s principles and applications in imaging carrier injection, diffusion, trapping, and recombination in photoactive materials.